Xenon-Diamond 2.3/116 25-1079718 High Resolution Line Scan Lens With Beam Splitter **SPECIAL ORDER**

**Special Order Item!**

The Schneider Optics Xenon-Diamond 2.3/116 (25-1079718) high resolution 3.5x line scan lens with beam splitter is optimized for the use with 12k (62.5 mm) line scan sensors with 5 µm pixel, but can also be used with 16k / 5 µm (82 mm) lines. The attached beam splitter enables on-axis illumination to avoid troublesome reflexes on specular surface as from wafer inspection.

The Xenon-Diamond 2.3/116 lens resolves 1.5 µm in object space and plus less than 0.04% distortion secures a homogeneous high MTF over the entire line. This is an important feature for high demanding OLED inspection systems. The Xenon-Diamond 2.3/116 is broadband AR coated and can be used from 400 nm in VIS up to 1000 nm in NIR spectrum, ideal for PCB inspection. The V-Mount makes it easy to install and rotate into the desired azimuth position for a wide range of line scan applications.

Xenon-Diamond 2.3/116 25-1079718 features

• For line scan cameras 12k (62.5 mm length/ pixel sizes approximately 5 μm) and 16k (82 mm length/ pixel sizes approximately 5 μm)
• Very high optical image quality for large sensors
• Vibration-insensitive for stable optical performance
• Lockable distance and aperture settings
• Industry-compatible V-mount interface
• Reliability and constant quality due to 100 % quality control
• With Beam Splitter